Scanning Electron Microscopy and X-ray Microanalysis

12:156, 51:156, 52:156, 60:156
Monday 4-5 PM
3 Semester Hours
Randy Nessler, Course Director

This course is designed to train participants in the application of various microscopy methods for their own research needs. As much training as possible will be done on samples provided by the students, so that meaningful results can be obtained quickly. The ultimate goal is to have everyone function independently and be able to decide when and when not to use a particular microscopy procedure. The student will be instructed on all aspects of the research project from sample preparation, imaging to data analysis. Theory, operation, and application of scanning electron microscopy, scanning probe microscopy, laser scanning microscopy and X-ray microanalysis will be presented.

Prerequisites: Established research project, a physical science course and consent of instructor.

Course Syllabus Course Requirements Presentation Guidelines

Lecture Notes Scanning Electron Microscopy X-ray Microanalysis Alternative Modes X-ray and Image Analysis by John J. Friel © Princeton Gamma-Tech, Inc