Atomic Force Microscopy is a technique of choice for non-destructive, high resolution imaging in many applications areas including biology, material science, electrochemistry, polymer science, data storage, magnetism, and semiconductors. In addition to surface topography, it also allows picoNewton resolution force measurements for single molecule mechanical studies (protein unfolding, adhesion, etc.).
In order to maximize the performance of an AFM, it is important to understand how an AFM works and how each component of the microscope plays a role in the optimization of these results. This talk will begin by explaining the basic principles of AFM. Then we will describe the design of the AFM, both as a stand-alone instrument as well as an integrated system with an inverted optical microscope. Several examples will be presented including data acquired using an AFM/optical microscopy system, such as combined AFM with epifluorescence, confocal, TIRF and optical phase contrast.
Instructor: Sophia Hohlbauch
Host: Jean Ross
Date: September 28th
Time & Location: 10am-11am Lecture MacEwan
mmmmmmmmmmmi1pm - 2pm Demonstration 87 CMRF
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