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JEOL
2100f Field Emission Transmission Electron Microscope
Room 84
C, Eckstein Medical Research Building
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- 200kV maximum accelerating voltage
- Electron Gun Assembly: Schottky FEG Emitter
 - Zr/W<100>
- Specimen Anticontamination Trap
- High Tilt Analytical Pole Piece (HTP)
- point to point resolution: 0.25nm, stage tilt angle: +/- 45 degrees for X, +/- 30 degrees for Y til axes, EDS solid angle: 0.13sr
- Cryoholder
- Double tilt Holder (Low background)
- STEM (Scanning Transmission Electron Microscope) Images
- Image Resoultion: 1.5 nm with HTP (Bright Field STEM at 200kV).
- Low Mag: 100x to 15,000x
- High Mag: 20,000x to 15,000,000x
- JEOL bright field detector
- Gatan high angle annular dark field (HAADF) detector
- Gatan Tridiem post column parallel detection EELS with 2k X 2k PIXEL ULTRASCAN 1000 CCD CAMERA
- NANOTRACE EDS DETECTOR WITH NORVAR WINDOW for
detection of light elements, 30mm straight Si(Li) crystal
- 138eV resolution
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